• Electrical Defect Imaging System

    • Hot spots & Dead Shorts
    • Electrical Properties (J-V)

    Manual & Automation-Ready Systems

    • Onboard SPC, Factory Automation
    • Over 3000 cells/ hour
    		 Pictures of Tau Science IRIS-100 & IRIS-200 Hotspot Inspection Systems

    Millions of cells measured @ leading production lines

    Our Solution: IRIS
  • IRIS Screencap showing Busbar Over-firing induced hotspot shunt defect
    Example: Busbar Over-Firing
  • IRIS Screencap showing Microcrack and Chip induced defects
    Example: Micro-Cracks
© Tau Science Corporation; Web-Site Powered by 100% Renewable Energy