First released in 2009, Tau Science’s IRIS product line screens for electrical shunt defects in cells which will lead to localized hotspots – a leading cause of PV cell performance problems and module degradation. Tau Science was the first company to bring a turnkey hotspot inspection system to the market and has built up years of experience delivering solutions to PV manufactures around the world. We continue to lead this field with the second generation product, introduced in 2011, that sets new standards of precision and accuracy at throughputs exceeding 3000 cells per hour.