We will see you all at the WCPEC-7 / IEEE PVSC conference in Hawaii. Please feel free to visit our booth at the tradeshow or arrange a meeting via firstname.lastname@example.org.
Tau's PulsQE has completed beta testing at the R&D center of a top-10 PV manufacturer, where it is used to map the EQE and Reflectance of fully encapsulated modules and investigate the various loss mechanisms that limit performance of a laminated device. An upcoming publication by Schneller et al in JPV will discuss the use of PulseQE for spatially resolved Loss Analysis, a technique often performed at just one or two locations on a cell, but with the speed of PulseQE it can now be used to generate thousands of points per cell. The system is now released for general sales, and can be configured for either mini- or full-sized modules. Please contact Tau to discuss the various configurations.
16-channel LBIC: a high speed Laser Beam Induced Current scanner that can be configured up to 16 independent wavelengths in the range 355 to 1625nm. The system can be configured with a goniometer to measure EQE as a function of angle-of-incidence, light bias and electrical bias, as well as an integrating sphere for simultaneous measurement of total reflectance and IQE.
PulseQE is an LED-based Quantum Efficiency system that can be ordered in basic desktop form or configured with a variety of advanced options including high speed scanning stage, integrating sphere for reflectance, and light bias. The pulse duration is controllable from 1-5000ms via the recipe, and this allows the system to measure both conventional silicon devices as well as those with slower response time. Please contact Tau with your specific measurement requirements, and we will configure a system for your application.