Tau's PulsQE has completed beta testing at the R&D center of a top-10 PV manufacturer, where it is used to map the EQE and Reflectance of fully encapsulated modules and investigate the various loss mechanisms that limit performance of a laminated device. An upcoming publication by Schneller et al in JPV will discuss the use of PulseQE for spatially resolved Loss Analysis, a technique often performed at just one or two locations on a cell, but with the speed of PulseQE it can now be used to generate thousands of points per cell. The system is now released for general sales, and can be configured for either mini- or full-sized modules. Please contact Tau to discuss the various configurations.